KLA

Top products in this category

Items 1 to 12 of 27 total
    KLA Nano Indenter G200
    The Nano Indenter G200 is the most accurate, flexible, user-friendly instrument for nanomechanical testing. Electromagnetic actuation allows unparalleled dynamic range in force and displacement and measurement of deformation over six orders of magnitude (from nanometers to millimeters).
    Gemini
    The new Gemini system from KLA is the world's first commercial, isometric multi-dimensional instrument for studying the dynamics of tribology and mechanical testing at the nano-scale. The device can measure the interaction of two objects that are sliding across each other - not merely making contact.
    NanoFlip
    By offering researchers the option to use the tool in both in-situ environments and ambient settings, depending on the demands of the experiment, the NanoFlip nanoindenter is designed to be the most versatile mechanical properties testing instrument on the market today.
    iMicro Nanoindenter
    When material testing requirements demand flexibility, data accuracy is crucial, and ease-of-use essential, the iMicro nanoindenter consistently delivers. This big brother to the groundbreaking iNano incorporates all the test reliability, user-friendly software and instrument capabilities, then ups the performance with high load nanoindentation.
    iNano Nanoindenter
    The iNano nanoindenter is made easy and affordable by offering repeatability, accuracy and precision at a price that puts nanoindentation capability into reach for any lab's budget.
    InSEM Microprobe Systems
    A tool for characterizing the mechanical properties of surfaces or structures, designed to function with sub-nanometer resolution in an in-situ vacuum environment.
    KLA T150 UTM
    The KLA universal testing machine (UTM) offers researchers a superior means of nanomechanical characterization. The state-of-the-art UTM T150 employs a nanomechanical actuating transducer to deliver high sensitivity over a large strain. Dynamic characterization captures evolution of mechanical properties such as strain, tensile strength and yield stress. And, The system comes complete with an acoustic chamber and vibration table, outstanding software that offers real-time experimental control and easy test protocol applications.
    MicroXAM-800 Optical Profiler
    White Light Interferometer for 3D Measurement of Surface Topography
    ZETA-580 Automated 300mm Metrology
    Fully Automated 300mm capable metrology tool that can address a variety of applications such as bump height, roughness, etch depth, film thickness as well as wafer bow.
    ZETA-388 Optical Profiler for PSS and AOI
    The Zeta-388 is a fully automated wafer metrology system capable of handling 6-inch or 8-inch wafers. The system can address a variety of applications such as bump height, roughness, etch depth, film thickness as well as wafer bow.
    ZETASCAN Series
    The ZetaScan series are fully automated 300mm capable defect inspection tools that can address a variety of substrates such as opaque and transparent wafers as well as touch panels, rough ground, polished or unpolished substrates.
    ZETA-500 3D Optical Profiler for 300mm Wafers
    The Zeta-500 profiler is a semi-automated 300mm capable metrology tool that can address a variety of applications such as bump height, roughness, etch depth, film thickness as well as wafer bow. Based on Zeta's revolutionary multi-mode approach to measurements, the Zeta-500 profiler packs the power of several tools into one compact platform.
Items 1 to 12 of 27 total

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