Items 1 to 12 of 27 total
    Express Test Option
    Designed exclusively for use with the KLA Nano Indenter G200 DCM II & XP heads and stages, Express Test allows up to 100 indents to be performed at 100 different surface sites in 100 seconds.
    ZETASCAN Series
    The ZetaScan series are fully automated 300mm capable defect inspection tools that can address a variety of substrates such as opaque and transparent wafers as well as touch panels, rough ground, polished or unpolished substrates.
    InSEM Microprobe Systems
    A tool for characterizing the mechanical properties of surfaces or structures, designed to function with sub-nanometer resolution in an in-situ vacuum environment.
    P-7 Stylus Profiler
    The KLA P-7 Stylus Profiler offers industry leading measurement readability for reliable measurement performance. With a 150 mm scan stage as standard, the P-7 is the only stylus profiler on the market offering long scan capability without stitching. A 2 µm radius stylus is standard, with options for sub-micron to 25 µm radii available.
    Lateral Force Measurement (LFM)
    The KLA Lateral Force Measurement (LFM) option for use with the standard XP head provides three-dimensional quantitative analysis for scratch testing, wear testing, and MEMS probing.
    Heating Stage
    The heating stage facilitates the study of materials of interest as they are heated from room temperature to as high as 350°C.
    ZETA-300 Precision Surface Metrology Optical Profiler
    The Zeta-300 is an advanced optical profiler designed to provide maximum configuration flexibility and enhanced measurement sensitivity and repeatability. The low noise floor of the Zeta-300 makes it suitable for nm level step height and roughness measurements.
    MicroXAM-800 Optical Profiler
    White Light Interferometer for 3D Measurement of Surface Topography
    By offering researchers the option to use the tool in both in-situ environments and ambient settings, depending on the demands of the experiment, the NanoFlip nanoindenter is designed to be the most versatile mechanical properties testing instrument on the market today.
    Alpha-Step D-600 Stylus Profiler
    The KLA Alpha-Step D-600 Stylus Profiler offers high resolution 2D & 3D profiling, 2D stress and profile stitching. These features and more are included in an easy to use platform with the best price to performance on the market. The D-600 system has the highest vertical range at 1200 µm, sub-Angstrom resolution and low force, 0.003 to 15 mg.
    High Load
    The KLA High Load option expands the load capabilities of KLA Nano Indenters up to 10 N of force, allowing the complete mechanical characterization of ceramics, bulk metals, and composites.
    KLA Nano Indenter G200
    The Nano Indenter G200 is the most accurate, flexible, user-friendly instrument for nanomechanical testing. Electromagnetic actuation allows unparalleled dynamic range in force and displacement and measurement of deformation over six orders of magnitude (from nanometers to millimeters).
Items 1 to 12 of 27 total

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