Items 1 to 12 of 27 total
    High Load
    The KLA High Load option expands the load capabilities of KLA Nano Indenters up to 10 N of force, allowing the complete mechanical characterization of ceramics, bulk metals, and composites.
    KLA Nano Indenter G200
    The Nano Indenter G200 is the most accurate, flexible, user-friendly instrument for nanomechanical testing. Electromagnetic actuation allows unparalleled dynamic range in force and displacement and measurement of deformation over six orders of magnitude (from nanometers to millimeters).
    ZETA-388 Optical Profiler for PSS and AOI
    The Zeta-388 is a fully automated wafer metrology system capable of handling 6-inch or 8-inch wafers. The system can address a variety of applications such as bump height, roughness, etch depth, film thickness as well as wafer bow.
    iNano Nanoindenter
    The iNano nanoindenter is made easy and affordable by offering repeatability, accuracy and precision at a price that puts nanoindentation capability into reach for any lab's budget.
    P-17 Stylus Profiler
    The KLA P-17 Stylus Profiler offers industry leading measurement readability for reliable measurement performance. With a 200 mm scan stage as standard, the P-17 is the only stylus profiler on the market offering long scan capability without stitching. The UltraLite® sensor provides the highest vertical resolution.
    New Enhanced NanoSuite 6.1 Software
    KLA NanoSuite 6.1 is a premium-performance software package designed for use with KLA Nano Indenter G200 and gives researchers in scientific and industrial settings an unprecedented combination of speed, flexibility, and ease of use for nanoindentation.
    Laser Heater
    This new, easy-to-use G200 system solution utilizes a precise high-power diode laser to heat both the stage and sample. Advantages include the ability to measure nanomechanical properties at precisely controlled temperatures and to test samples under highly dynamic temperature conditions.
    ZETA-500 3D Optical Profiler for 300mm Wafers
    The Zeta-500 profiler is a semi-automated 300mm capable metrology tool that can address a variety of applications such as bump height, roughness, etch depth, film thickness as well as wafer bow. Based on Zeta's revolutionary multi-mode approach to measurements, the Zeta-500 profiler packs the power of several tools into one compact platform.
    KLA T150 UTM
    The KLA universal testing machine (UTM) offers researchers a superior means of nanomechanical characterization. The state-of-the-art UTM T150 employs a nanomechanical actuating transducer to deliver high sensitivity over a large strain. Dynamic characterization captures evolution of mechanical properties such as strain, tensile strength and yield stress. And, The system comes complete with an acoustic chamber and vibration table, outstanding software that offers real-time experimental control and easy test protocol applications.
    The new Gemini system from KLA is the world's first commercial, isometric multi-dimensional instrument for studying the dynamics of tribology and mechanical testing at the nano-scale. The device can measure the interaction of two objects that are sliding across each other - not merely making contact.
    Continuous Stiffness Measurement (CSM)
    The KLA Continuous Stiffness Measurement (CSM) option satisfies application requirements that must take into account dynamic effects, such as strain rate and frequency. CSM is a powerful tool not only for stiff materials such as metals, alloys, and ceramics but also for time-dependent materials like polymers, structural composites, and biomedical materials.
    The KLA NanoVision nanomechanical microscopy option delivers quantitative imaging by coupling a linear electromagnetic actuation-based indentation head with a closed-loop nanopositioning stage.
Items 1 to 12 of 27 total

Sign up to our newsletter

Keep up to date with company news, product launches and industry news.

Sign up