- Compliant with ASTM standard
- Unique technology that delivers high sensitivity over a large range of strain
- Dynamic characterization mode captures evolution of mechanical properties with strain
- Flexible and upgradeable UTM that can be configured for a variety of new applications
- Outstanding software offers real-time experimental control and ease of test protocol development
The KLA T150 UTM is a universal testing machine that offers researchers a superior means of nanomechanical characterization. The state-of-the-art T150 employs a nanomechanical actuating transducer head to produce tensile force (load on sample) using electromagnetic actuation combined with a precise capacitive gauge, delivering outstanding sensitivity over a large range of strain.
The T150 UTM enables researchers to understand dynamic properties of compliant fibers via the largest dynamic range in the industry and the best resolution on the market (five orders of magnitude of storage and loss modulus). It also lets researchers investigate tension/compression properties of biological materials via a dynamic characterization mode that permits accurate measurement at each point during testing.
Additional advantages include fast, accurate generation of real-time test results; improved understanding of strain-rate-sensitive materials and time-dependent response; improved statistical sampling in biomaterials applications; and automated reporting of test results in both Microsoft Word and Excel.
The user-friendly design of the T150 UTM simplifies training requirements - standard tests can be run on the same day the instrument is installed. Every T150 is backed by highly responsive KLA customer service personnel. Knowledgeable and experienced regional applications engineers are available to guide users through more advanced testing, provide outstanding technical support, and offer unmatched applications expertise.
Maximum load 500 mN (50.8 gm) Load resolution 50 nN (5.1 µgm) Maximum actuating transducer displacement ±1 mm Displacement resolution < 0.1 nm Dynamic displacement resolution < 0.001 nm Maximum crosshead extension 200 mm Extension resolution 35 nm Extension rate 0.5 µm/s to 5 mm/s Dynamic frequency range (sample dependent) 0.1 Hz to 2.5 kHz CDA option Force amplitude range 0.1 µN to 4.5 mN Frequency range characterization of instrument dynamic response (sample dependent) 0.01 Hz to 200 Hz