KLA Nano Indenter G200

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Short Description
  • The Nano Indenter G200 is the most accurate, flexible, user-friendly instrument for nanomechanical testing. Electromagnetic actuation allows unparalleled dynamic range in force and displacement and measurement of deformation over six orders of magnitude (from nanometers to millimeters).

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Product Overview
  • Key Features and Benefits

    • Award-winning, high-speed Express Test option compatible with all G200 indentation DCMII and XP heads, and stages
    • Simple determination of indenter area function and frame stiffness
    • Accurate, repeatable results compliant with ISO 14577 standard
    • Electromagnetic actuation allows unparalleled dynamic range in force and displacement
    • Configurable for optimized routine testing or new applications
    • Modular options for imaging scratch, high-temperature, and dynamic testing
    • Outstanding software with real-time experimental control, easy test protocol development, and precision drift compensation

    Overview

    The culmination of decades of research and development, the KLA Nano Indenter G200 is the world's most accurate, flexible, and user-friendly instrument for nanoscale mechanical testing. Electromagnetic actuation allows the Nano Indenter G200 to achieve unparalleled dynamic range in force and displacement. Furthermore, KLA's innovative Express Test option, an award-winning technology that allows the world's fastest nanoindentation for mechanical-properties mapping, is compatible with all G200 indentation DCMII and XP heads, and stages.

    The Nano Indenter G200 enables users to measure Young's modulus and hardness in compliance with ISO 14577. The G200 also enables measurement of deformation over six orders of magnitude (from nanometers to millimeters). Modular options can be added to accommodate a variety of applications. The capabilities of the G200 can be extended to facilitate frequency-specific testing, quantitative scratch and wear testing, integrated probe-based imaging, high-temperature testing, expanded load capacity up to 10N, and customizable test protocols.

    With the Nano Indenter G200, users are able to quantify the relationship between structure, properties, and performance of their materials quickly and easily with minimal sample preparation. The user-friendly design of the G200 simplifies training requirements - standard tests can be run on the same day the instrument is installed. Every G200 is backed by highly responsive KLA customer service personnel. Knowledgeable and experienced regional applications engineers are available to guide users through more advanced testing, provide outstanding technical support, and offer unmatched applications expertise.

    Advanced Design

    All nanoindentation experiments rely on the accuracy of the fundamental load and the displacement data, requiring the highest precision control of load applied to the sample. The Nano Indenter G200 is powered by electromagnetic actuation-based force transducers to ensure precise measurements. The instrument's unique design avoids lateral displacement artifacts.

    Among the many benefits of the Nano Indenter G200 design are convenient access to the entire sample tray, excellent sample positioning accuracy, easy viewing of the sample position and the sample work area, and simplicity in sample height adjustment to speed test throughput. The modular controller design is optimized for future upgrades. In addition, the G200 conforms to ISO 14577 to ensure data integrity, gives users the ability to program experiments with each force transducer and switch between them at any time, and has an optimized lateral footprint to conserve lab space.

    Enhanced NanoSuite Professional Software

    Every Nano Indenter G200 comes with KLA NanoSuite Professional software, a premium-performance package that gives researchers in scientific and industrial settings an unprecedented combination of speed, flexibility, and ease of use. NanoSuite offers a variety of prewritten test methods, including an exclusive nanoindentation technique for making substrate-independent measurements of thin film materials, several novel techniques for testing polymers, and improved scratch test methods. KLA's field-proven method for testing in compliance with ISO 14577, the international standard for indentation testing, is provided as well.

    NanoSuite includes a fully integrated tool that greatly simplifies the determination of indenter area function and load-frame stiffness. Once a rather involved and time-consuming endeavor, this process now requires only a couple of mouse-clicks within the NanoSuite > 6.2 program. Prewritten methods for testing gels (DCM II indentation head and CSM option required) and for measuring strain-rate sensitivity (XP indentation head and CSM option required). Additional new capabilities allow a standard batch of tests comprising 25 or more samples to be set up in 5 minutes or less, 2D and 3D graphs and histograms to be plotted on-screen and exported directly to Microsoft Excel while preserving all labels and scales, and sample files to be organized by project and subproject. NanoSuite > 6.2 also provides Microsoft Windows 7 (32-bit) compliance for current systems and a convenient PDF printer to replace hardware printers.

    As in the package's previous iteration, an intuitive interface allows users to set up and run experiments quickly - changing test parameters as often as desired - with just a few clicks. NanoSuite > 6.2 offers support of small force/displacement measurements, surface topology, stiffness mapping, scratch tests, and more. Versatile imaging capabilities, a survey scanning option, and streamlined test method development help researchers get from testing to results in record time.

Specification
  • KLA Nano Indenter G200 specifications

    Standard XP Indentation Head

    Displacement resolution< 0.01 nm
    Total indenter travel1.5 mm
    Maximum indentation depth> 500 µm
    Load applicationCoil/magnet assembly
    Displacement measurementCapacitance gauge
    Loading capability
    Maximum load (standard)500 mN
    Maximum load with DCM II option30 mN
    Maximum load with High Load option10 N
    Load resolution50 nN
    Contact force< 1.0 µN
    Load frame stiffness~5 x 106 N/m
    Indentation placement
    Useable surface area100 mm x 100 mm
    Position controlAutomated remote with mouse
    Positioning accuracy1 µm
    Microscope
    Video screen25x (x objective mag.)
    Objective10x and 40x

    DCM II Indentation Head Option

    Displacement resolution0.0002 nm (0.2 picometers)
    Range of indenter travel70 µm
    Loading column mass< 150 mg
    Load applicationCoil/magnet assembly
    Displacement measurementCapacitance gauge
    Typical leaf spring stiffness~100 N/m
    Typical damping coefficient0.02 Ns/m
    Typical resonant frequency120 Hz
    Lateral stiffness80,000 N/m
    Loading capability
    Maximum load30 mN (13 gm)
    Load resolution3 nN (0.3 µgm)
    Express Test Option
    Time per indentationStandard < 5.0 sec

    LFM Option

    Maximum lateral force> 250 mN
    Lateral resolution< 2 µN
    Maximum scratch distance> 100mm
    Scratch speed100 nm/s up to 2 mm/s

    High Load Option

    Maximum force10 N
    Load resolution50 nN
    Maximum indentation depth≥ 500 µm
    Displacement resolution0.01 nm
    Frame stiffness≥ 5 x 106 N/m

    NanoVision Option

    X-Y scan range100 µm x 100 µm
    Z scan rangeIndentation head dependent
    Positioning accuracy≤ 2 nm
    Resonant frequency> 120 Hz
Standard
  • ISO 14577
Application
  • Artificial Tissue
  • Biological Tissue
  • Biomaterials
  • Ceramics
  • Composite Materials
  • DLC Films
  • Fibers
  • Hard Coatings
  • Lead-free Solder
  • MEMs (wafer applications)
  • Metals
  • Polymers
  • Thin Films
  • Semiconductor

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