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CX-200 Plus Scanning Electron MicroscopeThe COXEM CX-200 Plus Scanning Electron Microscope provides high performance in a compact size, at an attractive price. This full size SEM features high resolution imaging, and SE and BSE detectors. With a 5-axis motorised stage and chamber view camera as standard, the CX-200 Plus is easy to use. Analytical options include EDS, EBSD and CL detectors. -
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BSE DetectorCOXEM's BSE Detector is a 4 channel solid state detector, with excellent imaging ability. The BSE detector can be combined with the SE detector to provide SE+BSE imaging. With COXEM's Low Vacuum Mode, the BSE Detector is used to image uncoated samples. -
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Mounting PressThe Mounting Press is a hydraulic-pneumatic mounting press for encapsulating samples. Features programmable mounting cycles with control over temperatures and pressure. Prepares up to 2 mounts in under 9 minutes. -
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STEM DetectorFull Size and Tabletop SEMs from COXEM can be expanded with Scanning Transmission Electron Microscopy (STEM) capabilities with COXEM's STEM Detector. The STEM Detector is retractable to allow standard SEM functions, and features a true TEM detector positioned beneath the TEM sample. Supports BF and DF imaging, and with a holder for 4 TEM grids. -
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Polishing MachineThe Polishing Machine is a sturdy and reliable grinder and polisher for manual sample preparation. A powerful motor provides constant high torque, and digitally controlled speed between 10-990 RPM. Electronic coolant control with adjustable flow control. -
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EM-30 Plus & LE Benchtop Scanning Electron MicroscopeThe COXEM EM-30 benchtop Scanning Electron Microscope offers advanced, high-end features in a compact form factor. This benchtop SEM features high resolution imaging and dual SE and BSE detectors. A 3-axis motorised stage is included as standard for efficient and simple operation. -
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Low Vacuum SystemOptional Low vacuum SEM imaging can be used with COXEM SEMs to image no-conductive samples without coating. Low vacuum operation is used with the BSE detector for imaging. -
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Critical Point DryerCritical Point Drying is essential for preserving the surface structure of delicate samples during SEM sample preparation. This Critical Point Dryer features a simple and robust design that is easy to operate and maintain, with a large chamber. -
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CP-8000 Ion Mill Cross Section PolisherThe CP-8000 Ion Mill Cross Section Polisher gives a perfect finish for SEM sample preparation. Using an argon ion beam, the CP-8000 gently removes material from a sample's surface without deforming or smearing. Easy to use with a touch screen interface. -
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SPT-20 Ion Sputter CoaterThe SPT-20 Ion Sputter Coater is a simple to use, compact and cost-effective solution for sputter coating non-conductive specimens in SEM sample preparation. Features a user friendly touch screen interface, and supports multiple metal types. -
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Sawing MachineThe Sawing Machine is a precision low speed saw, specially designed for small delicate samples sensitive to heat. Features a gravity fed cutting system with adjustable force, digitally controlled variable speed, and cutting depth control. -
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EM-30AX Plus & LE Desktop Scanning Electron Microscope with EDSThe COXEM EM-30AX Desktop Scanning Electron Microscope offers advanced, high-end features in a compact form factor. This desktop SEM features high resolution imaging and dual SE and BSE detectors. A 3-axis motorised stage is included as standard for efficient and simple operation. The EM-30AX has integrated EDS for elemental microanalysis. -
