The AZtecOne Energy Dispersive Spectroscopy (EDS) System from Oxford Instruments is a simple and efficient solution for conducting EDS analysis. Powerful yet simple to use, AZtecOne provides a materials characterisation capability with proven stability and accuracy. AZtecOne EDS can be optionally integrated with a COXEM scanning electron microscope, to provide a combined solution for both SEM imaging and materials analysis.
Energy-dispersive X-ray spectroscopy (EDS, EDX, or EDXS) is an essential method for performing elemental analysis on samples. EDS techniques can be applied in-situ inside the chamber of an electron microscope.
The AZtecOne system consists of the intuitive AZtecOne software, and Oxford Instrument's highly accurate x-act Silicon Drift Detector (SDD). Oxford Instruments have designed AZtecOne to be fully compatible with COXEM's CX-200 Plus SEM.
- X-ray Mapping
- X-ray Linescanning
- Spectrum Acquisition
- Fast Reporting
- Reliable & Accurate SDD
Simple and Efficient
With AZtecOne, it is quick and easy to perform EDS analysis, however experienced the user is with using EDS technology. Accurate, informative results can be delivered rapidly with the streamlined and intuitive user interface of AZtecOne. A new user can be trained in minutes, and will be able to acquire images and produce reports in seconds.
The chemical distribution of a sample can be easily visualised with AZtecOne's X-ray mapping. A layered image, labelled with a colour key, visualises in a single image the phase and element distribution.
Common artefacts can be eliminated by the advanced TruMap functionality, which ensures a sample's true element distribution is shown. By separating spectra with overlapping peaks, false information is eliminated and accuracy improved.
The variation of elemental composition along a line can be visualised with X-ray Linescanning. Major and trace elements can be compared by normalising the display, and performing multiple linescans can be automated.
AZtecOne is powered by Oxford Instrument's Tru-Q technology, which provides greater analysis detail. By automatically detecting and identifying elements, Tru-Q enhances efficiency and improves quantified results. The MiniQuant viewer displays sample composition instantly, and acquisitions can be made from points, rectangular, circular or freehand regions.
Reports can be generated quickly and easily from the AZtecOne software. Data selection and report design can all be customised, and exported in a range of formats.
- 10mm2 Chip Size
- &lit;133ev Resolution
Oxford Instrument's x-act Silicon Drift Detector (SDD) is a proven and reliable instrument for delivering accurate quantitative results at all count rates. A fully quantative SDD, the x-act provides all the benefits of Oxford Instrument's renowned technology. Featuring a detector chip size of 10mm2, and resolution of <133eV. Peak position guaranteed to change no more than 1 eV between 1,000 cps and 100,000 cps.