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AZtecLive & ULTIM Max EDS System

Product Features

Key Features

  • Live Imaging & X-Ray Mapping
  • Live Sample Tracing
  • Live Element Identification
  • SDD with Largest Sensor Size
The ULTIM Max EDS system, with an example EDS image

Oxford Instruments AZtecLive

The AZtecLive & ULTIM Max Energy Dispersive Spectroscopy (EDS) System from Oxford Instruments bring a revolutionary new approach to performing EDS analysis. AZtecLive features live chemical X-ray imaging, showing users a real time view elemental distribution while navigating a sample. This offers greatly improved efficiency and productivity, by making areas of interest quicker to find.

An essential technology for performing elemental analysis on samples, Energy-Dispersive X-ray Spectroscopy (EDS, EDX or EDXS) is now faster and easier then every with AZtecLive. When performing EDS analysis in-situ inside a scanning electron microscope, AZtecLive allows for live chemical imaging alongside electron microscopy.

Oxford Instrument's ULTIM Max Silicon Drift Detector (SDD) if configurable with the largest SDD sensors available, up to 170mm2. These powerful and fast sensors are quick enough to collect usable data in real time, and power AZtecLive's live chemical imaging. ULTIM Max provide unparalleled speed and sensitivity, for even the most challenging EDS applications.

The AZtecLive & ULTIM Max EDS system has been developed to be fully compatible with COXEM's CX-200 Plus SEM.

Live Imaging and X-Ray Mapping

Combined the real time electron imaging of a SEM with real time chemical imaging is now possible with AZtecLive. Users can easily and quickly find areas of interest while navigating the sample, all in real time. AZtecLive will automatically transition between live imaging for navigation and full resolution imaging and mapping for analysis when areas are located.

Live Trace

AZtecLive automatically records the path a user has navigated across a sample, and automatically records the locations elements are detected. With AZtecLive, users will never loose the location of interesting features, and can quickly return to areas of interest. The relative concentration elements can be viewed, making it easy to find element hot spots.

Live Element Identification

Powered with Oxford Instrument's Tru-Q technology, AZtecLive can provide improved detail in EDS analysis. By automatically detecting and identifying elements, Tru-Q enhances efficiency and improves quantified results. An innovative pulse pile-up algorithm removes high count rate artefacts. The element spectrum is updated in real time in AZtecLive.

ULTIM Max Silicon Drift Detector

  • 100mm2 and 170mm2 Sensor Sizes
  • Low Noise X-Ray Detection
  • Quantative Analysis at 400,000 cps
  • Mapping at 1,500,00 cps
ULTIM Max Silicon Drift Detector

The ULTIM Max SDD from Oxford Instruments offers the largest available SDD sensor sizes, configurable with 100mm2 or 170mm2 sensors. In EDS, size really matters, and compared to a 10mm2 a 170mm2 detector can see data 17x faster or 17x greater area.

Powered by Oxford Instrument's Extreme electronics, the lowest noise signal detection and processing for SDD has been achieved. The ULTIM Max SDD has the lowest noise X-ray detection, providing the most accurate results.

Quantative analysis is possible at 400,000 cps, giving outstanding accuracy faster than ever before. Mapping at 1,500,000 cps provides greater capabilities than other detectors.

The large sensor sizes offered by the ULTIM Max allow beam damage and sample contamination to be minimised during EDS analysis. With a larger sensor, beam current can be greatly reduced, up to 17x less than a conventional 10mm2 sensor, protecting the sample.

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