Quick Links - Surface Metrology
We offer a wide range of instrumentation for critical surface measurements and analysis of the surface topography, which includes roughness and relations to processing and and performance.
Stylus and Optical – KLA: Our range of KLA Tensor Stylus and Optical Profilers are available to offer the most complete range of stylus surface measurement features meeting the needs of the engineering and research communities
Stress Measurement - Toho: Thin Film Stress Measurement Systems offer Industry Standard capabilities for mass production and research facilities that demand accurate stress measurements on various films and substrates
Refurbished AFM systems: We offer a wide range of refurbished systems for sale / lease along with upgrades and accessories. Service visits, planned maintenance and service contracts available worldwide
AFM Spare Parts: We supply a wide range of AFM spare parts to keep your systems fully operational
Probes/Accessories: Suppliers and distributors for Probes/Accessories for your AFM equipment